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  KEYWORD

Study, analysis and correlation of the breakdown of electronic devices with the manufacturing process

keywords ELECTRONICS DEVICES, FAILURE ANALISYS, MICROELECTRONICS

Reference persons SERGIO FERRERO, LUCIANO SCALTRITO

Research Groups AA - Materials and Processes for Micro and Nano Technologies

Thesis type EXPERIMENTAL RESEARCH, EXPERIMENTAL/MODELLING

Description The production yield is a key point for the the fabrication's sustainability of a electronics device. This thesis activity faces on field the reliability of a microelectronics fabrication process in order to recognize the material or the process that cause the random failure of a huge number of devices on each processed wafer.

Required skills The candidate must demonstrate a complete mastery of the manufacturing processes of electronic micro-devices, the main characterization techniques of semiconductor materials, both surface and bulk and good data analysis skills.


Deadline 17/06/2022      PROPONI LA TUA CANDIDATURA