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Embedded FLASH memory testing

azienda Thesis in external company    estero Thesis abroad


keywords TESTING

Reference persons PAOLO BERNARDI

Research Groups GR-05 - ELECTRONIC CAD & RELIABILITY GROUP - CAD

Thesis type RESEARCH / EXPERIMENTAL

Description Embedded FLASH memory testing is a fundamental objective of semiconductor industries, given the very large percentage of chips' surface occupied by them. The thesis aims to establish advanced implementation methodologies for validating eFLASH testing flow, including the usage of on-chip test engines to be programmed by firmware, and practical lab measurements. All stages from the concept to the implementation on-chip are covered in the thesis. The student will gain a broad insight into industrial SoC development. In collaboration with INFINEON, Munich.

Required skills Being familiar with digital circuit design
Knowledge about design for test (DFT)
EDA tools (Simulation-Fault simulation) and Python
Measurement Equipment

Notes The thesis worksite is Munich, Germany. The Infineon company grants a salary to the enrolled student.


Deadline 19/10/2021      PROPONI LA TUA CANDIDATURA