Servizi per la didattica

PORTALE DELLA DIDATTICA

04OIGLP, 03OIGNX

A.A. 2021/22

Course Language

Inglese

Course degree

1st degree and Bachelor-level of the Bologna process in Electronic And Communications Engineering - Torino

1st degree and Bachelor-level of the Bologna process in Electronic Engineering - Torino

Course structure

Teaching | Hours |
---|

Teachers

Teacher | Status | SSD | h.Les | h.Ex | h.Lab | h.Tut | Years teaching |
---|

Teaching assistant

Context

SSD | CFU | Activities | Area context |
---|---|---|---|

ING-INF/01 ING-INF/07 |
6 2 |
B - Caratterizzanti B - Caratterizzanti |
Ingegneria elettronica Ingegneria elettronica |

2020/21

This course gives students an introduction to the basic concepts and techniques of analog electronics.
After a review of the models of bipolar and MOS transistors, the course presents their application through a systematic study of elementary single-transistor amplifiers, then extended to the case of multistage systems. The properties and advantages of negative feedback in electronic circuits are examined, and alternative approaches for the analysis of feedback amplifiers are introduced.
A part of the program is devoted to the use of basic laboratory instruments.
Five lab sessions are organized to make students proficient with modern laboratory instrumentation.

This course gives students an introduction to the basic concepts and techniques of analog electronics.
After a review of the models of bipolar and MOS transistors, the course presents their application through a systematic study of elementary single-transistor amplifiers, then extended to the case of multistage systems. The properties and advantages of negative feedback in electronic circuits are examined, and alternative approaches for the analysis of feedback amplifiers are introduced.
A part of the program is devoted to the use of basic laboratory instruments.
Five lab sessions are organized to make students proficient with modern laboratory instrumentation.

Knowledge of large- and small-signal models of active semiconductor devices.
Knowledge of the basic configurations of analog amplifiers.
Knowledge of negative feedback systems, and of the effects of feedback on gain, bandwidth and impedances of analog amplifiers. Knowledge of alternative analytical approaches for the calculation of transfer functions and impedances of analog circuits.
Ability to calculate the bias point of BJT- and MOS-based amplifiers.
Ability to calculate the small-signal equivalent circuit parameters of active devices.
Ability to recognize the feedback topology and to evaluate its effects on a circuit.
Ability to calculate the transfer functions and network impedances of analog circuits.
Ability to choose the most convenient method to analyze a given analog circuit.
Ability to use the most common laboratory instruments.

Knowledge of large- and small-signal models of active semiconductor devices.
Knowledge of the basic configurations of analog amplifiers.
Knowledge of negative feedback systems, and of the effects of feedback on gain, bandwidth and impedances of analog amplifiers. Knowledge of alternative analytical approaches for the calculation of transfer functions and impedances of analog circuits.
Ability to calculate the bias point of BJT- and MOS-based amplifiers.
Ability to calculate the small-signal equivalent circuit parameters of active devices.
Ability to recognize the feedback topology and to evaluate its effects on a circuit.
Ability to calculate the transfer functions and network impedances of analog circuits.
Ability to choose the most convenient method to analyze a given analog circuit.
Ability to use the most common laboratory instruments.

Math: derivatives, integrals, Taylor's and Fourier's series; complex algebra; numerical solution of linear and systems of equations; Proficient use of a scientific pocket calculator.
Circuit theory: solution of linear networks both in the time and in the frequency domain. Bode plots.
Electronic devices: constitutive equations of diodes, BJTs and MOS transistors.
Physics I and II: dimensional analysis.

Math: derivatives, integrals, Taylor's and Fourier's series; complex algebra; numerical solution of linear and systems of equations; Proficient use of a scientific pocket calculator.
Circuit theory: solution of linear networks both in the time and in the frequency domain. Bode plots.
Electronic devices: constitutive equations of diodes, BJTs and MOS transistors.
Physics I and II: dimensional analysis.

a.1. Large- and small-signal models of diodes, BJTs and MOS transistors. Equivalent circuits for the determination of the bias point of bipolar and MOS transistor. Definition and calculation of the sensitivity of the bias point (1 ECTS)
a.2. BJT and MOS amplifiers. Load line, safe operating area. Fundamental topologies of single-stage amplifiers, voltage and current gains, input and output impedances (1 ECTS)
a.3. Multistage amplifiers. Impedances and transfer functions in circuits with reactive components. Frequency response (1 ECTS)
a.4. Feedback: classification and effects. Evaluation of closed-loop gains and impedances. Rosenstark's theorem and Blackman's formula; Miller’s theorem; Driving Point Impedance method (2 ECTS)
a.5. High frequency behavior of active devices; models for the determination of the cutoff frequency (1 ECTS)
b.1. Multimeters: voltmeters, ammeters and ohmmeters (1 ECTS)
b.2. Digital storage oscilloscopes (1 ECTS)

a.1. Large- and small-signal models of diodes, BJTs and MOS transistors. Equivalent circuits for the determination of the bias point of bipolar and MOS transistor. Definition and calculation of the sensitivity of the bias point (1 ECTS)
a.2. BJT and MOS amplifiers. Load line, safe operating area. Fundamental topologies of single-stage amplifiers, voltage and current gains, input and output impedances (1 ECTS)
a.3. Multistage amplifiers. Impedances and transfer functions in circuits with reactive components. Frequency response (1 ECTS)
a.4. Feedback: classification and effects. Evaluation of closed-loop gains and impedances. Rosenstark's theorem and Blackman's formula; Miller’s theorem; Driving Point Impedance method (2 ECTS)
a.5. High frequency behavior of active devices; models for the determination of the cutoff frequency (1 ECTS)
b.1. Multimeters: voltmeters, ammeters and ohmmeters (1 ECTS)
b.2. Digital storage oscilloscopes (1 ECTS)

The theory is presented in class mostly at the blackboard, and immediately applied to the study of circuits of increasing complexity. Alternative approaches to the solution of typical numerical problems are presented and discussed. Five 3-hour laboratory classes are devoted to practicing the use of basic modern instrumentation and to determine experimentally the transfer function of simple multi-stage BJT amplifiers.

The theory is presented in class mostly at the blackboard, and immediately applied to the study of circuits of increasing complexity. Alternative approaches to the solution of typical numerical problems are presented and discussed. Five 3-hour laboratory classes are devoted to practicing the use of basic modern instrumentation and to determine experimentally the transfer function of simple multi-stage BJT amplifiers.

Lecture notes on selected topics, numerical problems, homework assignments and laboratory manuals are available for download from the course website. There is no single reference textbook, but excerpts from the following texts are used as references for specific topics:
Adel S. Sedra, Kenneth C. Smith, Microelectronic Circuits, Oxford University Press (several editions available).
Richard C. Jaeger, Travis N. Blalock, Microelectronic circuit design, McGraw-Hill (several editions available).
Nihal Kularatna, Digital and analogue instrumentation: testing and measurement, The Institution of Engineering and Technology, 2003.

Lecture notes on selected topics, numerical problems, homework assignments and laboratory manuals are available for download from the course website. There is no single reference textbook, but excerpts from the following texts are used as references for specific topics:
Adel S. Sedra, Kenneth C. Smith, Microelectronic Circuits, Oxford University Press (several editions available).
Richard C. Jaeger, Travis N. Blalock, Microelectronic circuit design, McGraw-Hill (several editions available).
Nihal Kularatna, Digital and analogue instrumentation: testing and measurement, The Institution of Engineering and Technology, 2003.

The exam includes a written test and an oral discussion.
The written test, with an approximate duration of 2h10min, is organized in two parts:
• a closed-book section (approx. 40 min long) with one numerical problem on electronic measurements, in accordance to past exams and to the problems solved during the lectures, where the use of textbooks, notes etc. is not allowed;
• an open-book section (approx. 1h 30min long) with two or three numerical problems on electronic circuits, where students can use textbooks and notes (on paper, not in electronic form), but no electronic device apart from a pocket calculator.
The texts of all written tests since 2012 and their numerical solutions are available on the course website. The overall score of the written test is a weighted average of the scores of the electronic measurements (25%) and electronic circuits (75%) sections.
The students whose written test score is 18/30 or higher are admitted to the oral exam.
The oral exam (30-40 min) involves the electronic circuits part of the syllabus, starts from a review of the written test and includes at least two questions on the course topics. An optional part on electronic measurements (15 min, two questions) can be also arranged in advance. The final score is an average of the written and oral scores.
The grading is based on the ability of the student to address the analysis of analog circuits, to derive numerically correct results, and to discuss the fundamental concepts presented in the course.

The exam includes a written test and an oral discussion.
The written test, with an approximate duration of 2h10min, is organized in two parts:
• a closed-book section (approx. 40 min long) with one numerical problem on electronic measurements, in accordance to past exams and to the problems solved during the lectures, where the use of textbooks, notes etc. is not allowed;
• an open-book section (approx. 1h 30min long) with two or three numerical problems on electronic circuits, where students can use textbooks and notes (on paper, not in electronic form), but no electronic device apart from a pocket calculator.
The texts of all written tests since 2012 and their numerical solutions are available on the course website. The overall score of the written test is a weighted average of the scores of the electronic measurements (25%) and electronic circuits (75%) sections.
The students whose written test score is 18/30 or higher are admitted to the oral exam.
The oral exam (30-40 min) involves the electronic circuits part of the syllabus, starts from a review of the written test and includes at least two questions on the course topics. An optional part on electronic measurements (15 min, two questions) can be also arranged in advance. The final score is an average of the written and oral scores.
The grading is based on the ability of the student to address the analysis of analog circuits, to derive numerically correct results, and to discuss the fundamental concepts presented in the course.

The exam includes a written test and an oral discussion.
The written test, with an approximate duration of 2h10min, is organized in two parts:
• a closed-book section (approx. 40 min long) with one numerical problem on electronic measurements, in accordance to past exams and to the problems solved during the lectures, where the use of textbooks, notes etc. is not allowed;
• an open-book section (approx. 1h 30min long) with two or three numerical problems on electronic circuits, where students can use textbooks and notes (on paper, not in electronic form), but no electronic device apart from a pocket calculator.
The texts of all written tests since 2012 and their numerical solutions are available on the course website. The overall score of the written test is a weighted average of the scores of the electronic measurements (25%) and electronic circuits (75%) sections.
The students whose written test score is 18/30 or higher are admitted to the oral exam.
The oral exam (30-40 min) involves the electronic circuits part of the syllabus, starts from a review of the written test and includes at least two questions on the course topics. An optional part on electronic measurements (15 min, two questions) can be also arranged in advance. The final score is an average of the written and oral scores.
The grading is based on the ability of the student to address the analysis of analog circuits, to derive numerically correct results, and to discuss the fundamental concepts presented in the course.

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Corso Duca degli Abruzzi, 24 - 10129 Torino, ITALY

Corso Duca degli Abruzzi, 24 - 10129 Torino, ITALY