en
Politecnico di Torino
Anno Accademico 2011/12
04LTHOD
Electronic devices
Corso di Laurea in Ingegneria Fisica - Torino
Docente Qualifica Settore Lez Es Lab Tut Anni incarico
Ghione Giovanni ORARIO RICEVIMENTO PO IINF-01/A 70 30 0 0 14
SSD CFU Attivita' formative Ambiti disciplinari
FIS/03
ING-INF/01
2
6
A - Di base
B - Caratterizzanti
Fisica e chimica
Ingegneria elettronica
Presentazione
The course is mandatory for the Laurea degrees in Electronic Engineering and Physical Engineering, and is the first element of the chain that, starting from solid-state physics, will lead the student to understand both analog and digital complex circuits. In particular, the competences acquired in Electronic Devices will be directly applied at both the theoretical and experimental levels in the Electronic Circuits course.
Risultati di apprendimento attesi
-Knowledge of the main electronic properties of solids with particular attention to semiconductors
-Knowledge of the properties of a semiconductor in equilibrium
-Knowledge of the main transport parameters of electron and holes in a semiconductor
-Ability to evaluate equilibrium and out-of equilibrium concentrations in a semiconductor
-Detailed knowledge of the mail equations used to describe the behaviour of semiconductors in equilibrium and out of equilibrium
-Capability to apply the required simplifications and approximations to the semiconductor equations in the practically more important cases
-Capability to define the band diagram in a semiconductor structure and to derive qualitatively its electrical behaviour, both in equilibrium and out of equilibrium
-Knowledge of the charge density distribution in a metal-semiconductor junction
-Ability to foresee the electrical behaviour (rectifying or ohmic) of a metal-semiconductor junction based on the material used
-Knowledge of the charge density distribution in a p-n junction for doping profiles both uniform and position dependent
-Capability to relate the off-equilibrium behaviour of a junction diode to the main charge transport phenomena: forward and reverse bias, breakdown
-Capability to derive the large and small-signal models of a junction diode, and to relate them to the experimental behaviour
-Knowledge of the operating principle of bipolar junction transistors (BJTs) and of the equations defining their static behaviour, and capability to relate them to the static characteristics
-Capability to derive the large and small-signal models of a BJT, and to relate them to the experimental behaviour
-Knowledge of the operating principle of field effect transistors (FETs)
-Detailed knowledge of MOS systems in terms of charge distribution in the various operating regions: depletion, weak and strong inversion, accumulation
-Knowledge of the long channel MOSFET static behaviour, and of the main effects taking place for short channel lengths
-Capability to derive the large and small-signal models of a MOSFET, and to relate them to the experimental behaviour
-Knowledge of the floating gate devices used in non-volatile memories
-Knowledge of the main technological processes in a semiconductor
-Ability to evaluate from process parameters doping profiles and film thicknesses in a semiconductor process
-Ability to master the main issues concerning the semiconductor downscaling.
Prerequisiti / Conoscenze pregresse
Good knowledge of solid state physics basics: energy bands and charged carrier distributions. Detailed knowledge of the main quantities describing materials of interest in electronics, such as conductivity dielectric constant and their dependence on operating conditions: temperature and frequency. Knowledge of circuit theory basics for the understanding of the equivalent electrical models used for the description of semiconductor devices.
Programma
-Introduction to solid-state physics
-Solids: electronic behaviour, band structure
-Semiconductors: electrons and holes, density of states and statistics
-Semiconductors in equilibrium
-Semiconductors out of equilibrium: transport and generation-recombination (GR)
-Transport in semiconductors: scattering, mobility, saturation velocity
-Transport in semiconductors: diffusion, diffusivity, Einstein relationship
-GR: direct, trap assisted. Lifetime approximation
-Doped semiconductor band diagrams, calculation of the free carrier concentrations
-Schockley equations
-Conduction in semiconductors: drift and diffusion
-Mathematical model of semiconductors
-Applications of the mathematical model to some significant examples of off equilibrium semiconductors
-Equilibrium metal-semiconductor junction: band diagram and electrostatics
-Effect of an applied voltage bias to a metal-semiconductor junction: ohmic or rectifying behaviour, depletion charge variation, depletion capacitance
-Equilibrium p-n junction: band diagram and electrostatics
-Effect of the applied bias to a p-n junction: depletion charge variation and depletion capacitance
-Measurement of the junction built in voltage based on 1/C^2
-Quasi Fermi levels and junction law
-Junction currents and static model evaluation
-Current distribution in forward and reverse bias
-Impact of series resistances on the static characteristics
-Diode turn on voltage
-Junction breakdown effects
-Charge control model and diffusion capacitance
-Large- and small-signal junction diode model derivation
-Operating principle of the bipolar transistor BJT
-Currents and main parameters of the BJI in forward operation
-Carrier concentration calculation in the base and collector
-Ebers-Moll equations derivation and static model
-BJT in reverse operation, saturation and cutoff
-BJT small-signal characteristics and model
-MOS system: equilibrium band diagram and effects of the applied bias
-Population inversion
-Calculation of the semiconductor total charge as a function of bias
-Strong inversion MOS systems and threshold voltage calculation
-CMOS systems: n channel and p channel MOSFETs
-MOSFET gradual channel analysis
-Long channel static MOSFET model in the quadratic region and in saturation
-Substrate effect
-Large and small-signal MOSFET model
-MOSFET short channel effects
-Principles of semiconductor technology: crystal growth, epitaxy, doping processes, film growth and oxidation, metal deposition, etching
-Semiconductor technology: photolitography, bipolar integrated circuits, MOS integrated circuits
-Semiconductor technology evolution: scaling down, Moore’s law
-Semiconductor technology: compound semiconductor basics
Organizzazione dell'insegnamento
Practice classes will allow the students to quantitatively apply the equations derived in class on semiconductor structures strictly related to realistic devices.
Testi richiesti o raccomandati: letture, dispense, altro materiale didattico
Lectures will exploit the projector so that all the produced materials will be made available on the course website. Exercises are discussed and solved in room. Homework exercises are also provided in .pdf format for self-learning and preparation of the final exam.
Suggested references are:
Ben Streetman, Sanjay Banerjee, Solid State Electronic Devices (6th Edition), Prentice Hall
G. Ghione, Dispositivi per la microelettronica, McGraw 1998 (in Italian)
Criteri, regole e procedure per l'esame
The examination is a written test including 18/30 questions (open and multiple choice), 12/30 numerical problems. The maximum score with a written test is 30/30, access to an oral test is required to obtain 30 cum laude.
Altre informazioni

The requirement of prerequisites in the area of electronic material physics, provided in the Physics II course, requires to delay the start of Electronic Devices lectures of at least 2 weeks. In the first 2 weeks, the schedule will be exploited by Physics 2:
WK1-2 FISII 8*1.5 DISP 0
WK3-10 FISII 2*1.5 DISP 6*1.5
WK11-14 FISII 2*1.5 DISP 5*1.5
TOT 60 102
Orario delle lezioni
Statistiche superamento esami

Programma definitivo per l'A.A.2015/16
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