PERIODO: MAGGIO 2018 Il corso sarà tenuto dal prof. Don Lucca della Oklaoma University The course will be divided into two parts: Part 1: mathematical foundations for the field of surface mechanics; Part 2: overview of experimental tools used for high resolution characterization of the mechanical, structural, chemical and optical properties of surfaces.

Introduction to Surface Mechanics 1. Surface Temperatures in Moving Bodies - Instantaneous point heat source infinite medium - Instantaneous point heat source semi-infinite medium - Continuous point heat source semi-infinite medium - Instantaneous point heat source on moving semi-infinite medium - Continuous point heat source on moving semi-infinite medium - Continuous line heat source on moving semi-infinite medium - Continuous strip heat source on moving semi-infinite medium - Continuous strip heat source on moving semi-infinite medium -- Fourier Method - Continuous strip heat source on a moving layered semi-infinite medium 2. Stress and Deformation Fields in Semi-infinite Media - Stress-strain relations for a linear isotropic elastic solid - Navier equations - Fundamental potential functions for problems of elastostatics - The Kelvin problem - Stress field and displacement field for the Kelvin problem - Concentrated force acting vertically on an elastic half-space - Concentrated force acting tangentially on an elastic half-space - The Boussinesq problem - The Cerruti problem - Distributive normal load on the surface of an elastic half-space - Distributive tangential load on the surface of an elastic half-space - The Flamant problem - An elastic half-space subjected to a distributive load over a strip Properties and High Resolution Characterization of Surfaces 1. Electron and X-Ray Spectroscopies - X-ray photoelectron spectroscopy (XPS) - Auger electron spectroscopy (AES) - Energy dispersive x-ray spectroscopy (EDS) - Extended x-ray absorption fine structure (EXAFS) 2. Electron Diffraction - Low energy electron diffraction (LEED) - Reflection high energy electron diffraction (RHEED) 3. Ion Spectroscopies - Secondary ion mass spectrometry (SIMS) - Rutherford back scattering (RBS) 4. Scanning Probe Microscopies - Scanning tunneling microscopy (STM) - Atomic force microscopy (AFM) 5. Nanoindentation 6. Recent studies using surface characterization techniques

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Gli studenti e le studentesse con disabilità o con Disturbi Specifici di Apprendimento (DSA), oltre alla segnalazione tramite procedura informatizzata, sono invitati a comunicare anche direttamente al/la docente titolare dell'insegnamento, con un preavviso non inferiore ad una settimana dall'avvio della sessione d'esame, gli strumenti compensativi concordati con l'Unità Special Needs, al fine di permettere al/la docente la declinazione più idonea in riferimento alla specifica tipologia di esame.