Prof. Don A. Lucca - Oklahoma University The course aims at providing mathematical foundations for surface mechanics and an overview of experimental tools for high resolution characterization of surfaces properties

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This course will be 20 hrs which will include lectures and student work outside of class. It will be given over a period of 4 days. It will be divided, approximately equally, between Part 1 which will cover the mathematical foundations for the field of surface mechanics, and Part 2 which will give an overview of various experimental tools which are used for high resolution characterization of the mechanical, structural, chemical and optical properties of surfaces. An outline is included below. Introduction to Surface Mechanics 1. Surface Temperatures in Moving Bodies - Instantaneous point heat source infinite medium - Instantaneous point heat source semi-infinite medium - Continuous point heat source semi-infinite medium - Instantaneous point heat source on moving semi-infinite medium - Continuous point heat source on moving semi-infinite medium - Continuous line heat source on moving semi-infinite medium - Continuous strip heat source on moving semi-infinite medium - Continuous strip heat source on moving semi-infinite medium -- Fourier Method - Continuous strip heat source on a moving layered semi-infinite medium 2. Stress and Deformation Fields in Semi-infinite Media - Stress-strain relations for a linear isotropic elastic solid - Navier equations - Fundamental potential functions for problems of elastostatics - The Kelvin problem - Stress field and displacement field for the Kelvin problem - Concentrated force acting vertically on an elastic half-space - Concentrated force acting tangentially on an elastic half-space - The Boussinesq problem - The Cerruti problem - Distributive normal load on the surface of an elastic half-space - Distributive tangential load on the surface of an elastic half-space - The Flamant problem - An elastic half-space subjected to a distributive load over a strip Properties and High Resolution Characterization of Surfaces 1. Electron and X-Ray Spectroscopies - X-ray photoelectron spectroscopy (XPS) - Auger electron spectroscopy (AES) - Energy dispersive x-ray spectroscopy (EDS) - Extended x-ray absorption fine structure (EXAFS) 2. Electron Diffraction - Low energy electron diffraction (LEED) - Reflection high energy electron diffraction (RHEED) 3. Ion Spectroscopies - Secondary ion mass spectrometry (SIMS) - Rutherford back scattering (RBS) 4. Scanning Probe Microscopies - Scanning tunneling microscopy (STM) - Atomic force microscopy (AFM) 5. Nanoindentation 6. Recent studies using surface characterization techniques

In presenza

Presentazione orale - Presentazione report scritto

P.D.2-2 - Maggio

May 15-18, 2023