By the end of the teaching activity, students will: Acquire knowledge and understanding • Describe the internal functional blocks, operating limits, and non-ideal models of operational amplifiers, including static, dynamic, frequency-response, stability, and power limitations. • Explain the operation of linear and nonlinear operational amplifier circuits, active filters, comparators, waveform generators, sinusoidal oscillators, solid-state switches, logic gates, power supplies, and data acquisition systems. • Identify the main performance parameters and trade-offs of analog, digital-interface, power, and data-conversion circuits. Be able to apply knowledge and understanding • Analyze and dimension basic operational amplifier circuits, including amplifiers, adders, differential and instrumentation amplifiers, integrators, differentiators, current sources, nonlinear amplifiers, precision rectifiers, comparators, waveform generators, and oscillators. • Analyze and design active filters by relating transfer functions, characteristic frequency, bandwidth, quality factor, gain, and circuit component values. • Dimension transistor switches and interface circuits for different load types, considering drive requirements, switching transients, dynamic behavior, galvanic isolation, and safe operating limits. • Analyze basic logic-gate implementations and sequential logic circuits, including static and dynamic electrical behavior. • Analyze and dimension linear and switching power-supply circuits, considering regulation, ripple, efficiency, dissipation, and load requirements. • Select and configure data acquisition chains, including conditioning amplifiers, anti-aliasing filters, D/A converters, A/D converters, sample-and-hold circuits, sampling constraints, quantization, timing, and noise limitations. Perform laboratory work and develop communication skills and engineering judgement • Use bench laboratory instrumentation (oscilloscope, power supply, signal generator, and related equipment) hands-on to test electronic circuits, compare measurements with theoretical predictions, and troubleshoot deviations. • Prepare technical reports that document design choices, experimental methods, measurement results, uncertainty sources, and conclusions. • Make justified engineering approximations and design decisions when solving practical circuit problems.

Students must understand the theory of electrical networks, their analysis in the time and frequency domains, the linear operation of bipolar and MOS transistors, the concept of bias and small-signal operation, and have a basic understanding of signal theory and feedback. Laboratory experiments require prior familiarity with the use of bench laboratory instruments (oscilloscope, power supply, and signal generator), basic measurement techniques, and experimental data processing.

The classroom part of the teaching activity consists of lectures and exercises for a total of 8.2 CFU. The laboratory part accounts for an additional 1.8 CFU. Operational amplifiers and their applications, active filters, nonlinear circuits, comparators, waveform generators, and oscillators — 4.15 CFU Operational amplifier internal structure, current mirrors, differential stages, output stages, real operational amplifier limitations, static and dynamic errors, frequency response, stability, power limitations, linear operational amplifier circuits, adders, differential and instrumentation amplifiers, integrators, differentiators, current sources, active filters, nonlinear amplifiers, logarithmic and exponential circuits, precision rectifiers, peak detectors, threshold comparators, hysteresis, astable multivibrators, triangular-wave generators, sinusoidal oscillators, and voltage-controlled oscillators. Solid-state switches, load interfaces, logic circuits, and sequential circuits — 1.95 CFU BJT and MOS switches, static and dynamic behavior, bidirectional switches, transmission gates, low-side and high-side driving, resistive/capacitive/inductive loads, switching transients, safe operating area, galvanic isolation, logic gates, CMOS gates, logic families, static and dynamic logic parameters, open-drain and three-state outputs, Schmitt-trigger inputs, latches, flip-flops, counters, and synchronization-related dynamic behavior. Power supplies — 1.05 CFU Power-supply specifications, structure of a power-supply unit, rectification and filtering, Zener and linear voltage regulators, efficiency and thermal limits, switching converters, duty cycle, ripple, continuous and discontinuous conduction, component stresses, and design trade-offs between linear and switching regulation. Data acquisition systems — 0.75 CFU Sampling, quantization, signal-to-noise ratio, dynamic range, conditioning amplifiers, anti-aliasing filters, D/A converters, A/D converters, sample-and-hold / track-and-hold circuits, acquisition time, timing constraints, and multiplexed acquisition systems. Integrated system design, recap, and exam-oriented exercises — 0.30 CFU Integration of analog conditioning, filtering, switching, power supply, logic-interface, and data-conversion blocks into small electronic systems; discussion of representative exam-like problems and cross-topic design decisions.

Interested lab groups can optionally borrow a lab kit (free of charge) from the LED staff for the duration of the course to experiment independently with lab tasks and system design.

The course is delivered through classroom lectures and exercises (8.2 CFU) and experimental laboratory work (1.8 CFU). Subject to technical conditions, lectures are normally streamed in real time, recorded, and made available on the course portal. Six experimental laboratory activities are planned throughout the course and take place at the LED Labs https://led.polito.it/. Attending them is not compulsory, and the exam can be passed without a laboratory grade, but lab grades can only be earned by carrying out the activities in person: what matters for the course's learning outcomes is hands-on use of bench laboratory instrumentation (oscilloscope, power supply, signal generator, and related equipment) to build, measure, and troubleshoot real circuits; this practical experience cannot be replaced by simulation or remote work. The lab activity must be carried out in groups of no more than four students, who must work together at all stages to develop teamwork and collaboration skills. The students must freely form their own lab groups by joining empty groups provided by the professor, e.g., on Moodle. The professor may request changes at any time to improve the teaching, such as balancing the lab workload or avoiding overlaps that would prevent students from attending labs in person. Unless explicitly authorized by the professor, the use of generative AI tools is forbidden in all the activities related to this course. Each course activity is designed to develop distinct competences such as hands-on measurement and troubleshooting, critical thinking, weighing alternatives, result analysis, technical writing and communication, and organization, which are learned only by working through the difficulties personally. Each lab project consists of three parts: design, experiment, and report. Students are given general instructions on how to conduct lab experiments and write a lab report, as well as a detailed description of each lab session they will conduct to guide them: • Design the necessary parts of the experiment. • Perform the hands-on experiments. • Write the final lab report. Lab reports are graded to determine the lab grade for each lab group. Students in each lab group must work together to complete only one report per group and upload it on the course site by the specified deadlines, as described in the lab instructions. Lab reports are graded based on: • Completion of the assignment. • Quality of preparatory and experimental work. • Quality and thoroughness of the presentation of the design and experimental work. • Quality and thoroughness of the discussion of the results. The laboratory grade contributes 20 % to the final grade, as specified in the assessment criteria. The topics of the lab assignments are: 1) Operational Amplifier Characteristics, which covers the operation of the main blocks of operational amplifiers, as well as their limitations. 2) Characterization of instrumentation amplifiers, covering linear operation applications of operational amplifiers as well as their limitations. 3) Active filter design, covering the frequency response of operational amplifier circuits and the effect of component tolerances. 4) Triangle and square wave generator, covering non-linear applications of operational amplifiers and limits. 5) Asynchronous counter, which covers the electrical behavior of logic gates and switching transistors. 6) Digital-to-analog converters, covering data acquisition systems and related topics. Once achieved, lab scores are valid indefinitely.

Lecture notes are available on the course portal, along with instructions and materials for labs and exercises (including solutions). For in-depth information and discussion of course topics, the following textbooks are recommended: • Adel S. Sedra and Kenneth C. Smith, "Microelectronic Circuits," 7th Edition, Oxford University Press, 2015. ISBN 978-0199339143. • R.C. Jaeger, T.N. Blalock, & B.J. Blalock, "Microelectronic Circuit Design," 6th Edition, McGraw-Hill Education, 2022. ISBN 978-1260597851. • Sergio Franco, "Design with Operational Amplifiers and Analog Integrated Circuits," 4th Edition, McGraw-Hill Education, 2015. ISBN 978-0078028168. • Neil Storey, "Electronics: A Systems Approach," 4th Edition, Harlow, England; New York: Pearson/Prentice Hall, 2009. ISBN 978-0273719182.

Lecture slides; Lecture notes; Text book; Exercises; Exercise with solutions ; Lab exercises; Video lectures (current year); Simulation tools; Self-assessment tools;

Exam: Written test; Optional oral exam; Group project;

Exam types The final assessment consists of: • a mandatory written test; • group laboratory reports; • an optional oral exam, available only after a valid written test; • a possible professor-required oral verification, in case of doubt about the written test. Written test The written test is in person and lasts two hours. It consists of four problems and nine quizzes, covering all topics taught in lectures, exercises, and laboratory activities. The written test is graded on a raw scale of 31 points: • four problems: maximum 22 points; • nine quizzes: maximum 9 points, 1 point each. Each quiz consists of one question and four predefined answers. Only one answer is correct. A correct answer gives 1 point; an incorrect or missing answer gives 0 points. There is no penalty for wrong answers. The problems test the ability to select and apply circuit models, perform calculations, dimension components, evaluate non-idealities and performance limits, and make justified engineering decisions in practical circuit and system-design situations. The quizzes test knowledge, conceptual understanding, and the ability to distinguish between plausible but incorrect statements about circuit operation, limitations, and design trade-offs. No outside material may be used during the written test: no slides, notes, books, phones, smart watches, headsets, PCs, programmable calculators, or communication with other people. Only non-programmable calculators are allowed. Exam-like exercises and examples are made available on the course portal. Laboratory grade The laboratory grade is based on the reports submitted by each laboratory group. Six laboratory activities are planned. The final laboratory grade L is expressed on a scale from 0 to 6 and is obtained by averaging the best five report grades out of six. Missing reports receive 0 points. Once obtained, the laboratory grade remains valid indefinitely. Laboratory reports are assessed on: • completion of the assigned work; • correctness of the preparatory design; • consistency between design objectives, circuit implementation, and experimental method; • appropriate use of instrumentation and measurement settings; • quality of measurements and data presentation; • quality of the discussion of discrepancies between theory and experiment; • clarity and completeness of the technical report; • evidence of personal involvement in the group work. Authorship of submitted material All material submitted for evaluation must reflect the knowledge of the students who submit it. It is not allowed to present as one's own work produced by others, or generated by AI tools. Students must be able to explain and justify every design choice, calculation, measurement, procedure, and conclusion in what they submit. Whenever this is in doubt, the professor may examine the students in depth, using written or oral questions appropriate to ascertain their actual knowledge. The grade of the submitted material is assigned to its authors, but any of them who cannot support it during a cross-examination at a comparable level may have the grade lowered, down to zero. Final grade formula and “cum laude” Let W be the raw written-test score, 0 ≤ W ≤ 31. Let L be the laboratory grade, 0 ≤ L ≤ 6. Let O be the oral score, −3 ≤ O ≤ 3, with O = 0 if no oral exam is taken. The written test is valid only if W ≥ 18. Then the final score F is calculated as: F = W ⋅ 24/30 + L + O The written test contributes 80 % of the ordinary final grade, corresponding to 24 points out of 30 when W = 30. The laboratory grade contributes 20 %, corresponding to a maximum of 6 points out of 30. The exam is passed if the written test is valid and F ≥ 18. The ordinary grade recorded is F rounded to the nearest integer, capped at 30/30. A calculated score F > 30 gives 30 cum laude. Optional oral exam Students with a valid written test, W ≥ 18, may request an optional oral exam before accepting the grade. The optional oral exam consists of up to four theoretical questions, simple problems, or discussions on related topics. It tests the same knowledge and abilities as the written test, with particular emphasis on explanation, derivation, interpretation of results, and connections between different parts of the syllabus. Each oral topic is scored from –3 to +3. Positive scores are assigned to correct, complete, and well-justified answers. Negative scores are assigned to incorrect answers, unjustified reasoning, or serious conceptual errors. The average oral score O is algebraically added to the final score, as defined above. The oral exam may therefore increase or decrease the final grade by up to 3 points. If the resulting final score is below 18/30, the exam is failed. Professor-required oral verification The professor may require an additional oral verification in case of doubt about the knowledge demonstrated in the written test. This oral verification has the same structure as the optional oral exam, but it can only confirm or reduce the grade. It cannot increase the grade. If the verification reveals serious gaps or inconsistencies, the final score may be reduced. If the resulting score no longer satisfies the passing conditions, the exam is failed. The expected learning outcomes are assessed as follows, by topic: 1. Operational amplifier operation, internal blocks, and real limitations tested by: written problems, quizzes, lab reports, optional oral exam. 2. Linear operational amplifier circuit analysis and design tested by: written problems, quizzes, lab reports, optional oral exam. 3. Active-filter transfer functions, characteristic frequency f0, bandwidth, quality factor Q, and topology choice tested by: written problems, quizzes, lab reports, optional oral exam. 4. Nonlinear operational amplifier circuits, comparators, hysteresis, and waveform generators tested by: written problems, quizzes, lab reports, optional oral exam. 5. Sinusoidal oscillators and voltage-controlled oscillators tested by: written problems, quizzes, optional oral exam. 6. BJT and MOS switching, load interfaces, isolation, safe operating area, and dynamic behavior tested by: written problems, quizzes, lab reports, optional oral exam. 7. Logic-gate electrical behavior and sequential circuits tested by: written problems, quizzes, lab reports, optional oral exam. 8. Linear and switching power supplies tested by: written problems, quizzes, optional oral exam. 9. Data acquisition, A/D and D/A converters, sampling, sample-and-hold circuits, timing constraints, and quantization errors tested by: written problems, quizzes, lab reports, optional oral exam. 10. Use of instruments, measurement methods, and troubleshooting tested by: written problems, quizzes, lab reports and, in case of doubt about the authorship of a report, an in-depth written or oral verification on its specific contents. 11. Technical reporting and discussion of experimental results tested by: lab reports. 12. Ability to explain, justify, and connect concepts across different course topics tested by: written problems, quizzes, lab reports, and optional oral exam.

In addition to the message sent by the online system, students with disabilities or Specific Learning Disorders (SLD) are invited to directly inform the professor in charge of the course about the special arrangements for the exam that have been agreed with the Special Needs Unit. The professor has to be informed at least one week before the beginning of the examination session in order to provide students with the most suitable arrangements for each specific type of exam.