PERIODO: MAGGIO 2018

Il corso sarà tenuto dal prof. Don Lucca della Oklaoma University


The course will be divided into two parts: Part 1: mathematical foundations for the field of surface mechanics; Part 2: overview of experimental tools used for high resolution characterization of the mechanical, structural, chemical and optical properties of surfaces.

Introduction to Surface Mechanics

1. Surface Temperatures in Moving Bodies
- Instantaneous point heat source infinite medium
- Instantaneous point heat source semi-infinite medium
- Continuous point heat source semi-infinite medium
- Instantaneous point heat source on moving semi-infinite medium
- Continuous point heat source on moving semi-infinite medium
- Continuous line heat source on moving semi-infinite medium
- Continuous strip heat source on moving semi-infinite medium
- Continuous strip heat source on moving semi-infinite medium -- Fourier Method
- Continuous strip heat source on a moving layered semi-infinite medium

2. Stress and Deformation Fields in Semi-infinite Media
- Stress-strain relations for a linear isotropic elastic solid
- Navier equations
- Fundamental potential functions for problems of elastostatics
- The Kelvin problem
- Stress field and displacement field for the Kelvin problem
- Concentrated force acting vertically on an elastic half-space
- Concentrated force acting tangentially on an elastic half-space
- The Boussinesq problem
- The Cerruti problem
- Distributive normal load on the surface of an elastic half-space
- Distributive tangential load on the surface of an elastic half-space
- The Flamant problem
- An elastic half-space subjected to a distributive load over a strip

Properties and High Resolution Characterization of Surfaces

1. Electron and X-Ray Spectroscopies
- X-ray photoelectron spectroscopy (XPS)
- Auger electron spectroscopy (AES)
- Energy dispersive x-ray spectroscopy (EDS)
- Extended x-ray absorption fine structure (EXAFS)

2. Electron Diffraction
- Low energy electron diffraction (LEED)
- Reflection high energy electron diffraction (RHEED)

3. Ion Spectroscopies
- Secondary ion mass spectrometry (SIMS)
- Rutherford back scattering (RBS)

4. Scanning Probe Microscopies
- Scanning tunneling microscopy (STM)
- Atomic force microscopy (AFM)

5. Nanoindentation

6. Recent studies using surface characterization techniques