Politecnico di Torino
Politecnico di Torino
   
Login  
en
Politecnico di Torino
Anno Accademico 2009/10
02JDEGH
Physics and applications of advanced microscopes
Corso di L. Specialistica in Nanotecnologie Per Le Ict (To/Grenoble/Losanna) - Torino/Grenoble/Losanna
Docente Qualifica Settore Lez Es Lab Tut Anni incarico
SSD CFU Attivita' formative Ambiti disciplinari
FIS/03 2 A - Di base Fisica e chimica
Obiettivi dell'insegnamento
To give an overview of the fundamentals of scanning-probe microscopy (STM, AFM, Near-Field optics) and of their place in the present development of nanoscience and nanotechnology
Programma
Architecture of a Scanning-Probe Microscope
General concepts
Instrumental aspects: displacements on the nanometer scale, regulation ..
Scanning Tunnelling Microscopy (STM)
Principles of STM
STM imaging
STM spectroscopy
Atomic-Force Microscopy (AFM)
The different operation modes
Electric-Force Microscopy (EFM) and Nanoelectronics
Detection of ultrasmall forces
Introduction to Near-field Scanning Optical Microscopy (NSOM)
Key concepts in near-field optics
Sub-wavelength photonics
Plasmonics and addressing of single nano-objects
Nanomanipulation by means of Scanning-Probe Microscopy
Quantum corrals, AFM nanolithography, optical nano-tweezers'
Statistiche superamento esami

Programma definitivo per l'A.A.2009/10
Indietro



© Politecnico di Torino
Corso Duca degli Abruzzi, 24 - 10129 Torino, ITALY
WCAG 2.0 (Level AA)
Contatti