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Politecnico di Torino
Academic Year 2009/10
02JDEGH
Physics and applications of advanced microscopes
Master of science-level of the Bologna process in Nanotechnologies For Ict Engineering - Torino/Grenoble/Losanna
Teacher Status SSD Les Ex Lab Tut Years teaching
SSD CFU Activities Area context
FIS/03 2 A - Di base Fisica e chimica
Objectives of the course
To give an overview of the fundamentals of scanning-probe microscopy (STM, AFM, Near-Field optics) and of their place in the present development of nanoscience and nanotechnology
Syllabus
Architecture of a Scanning-Probe Microscope
General concepts
Instrumental aspects: displacements on the nanometer scale, regulation ..
Scanning Tunnelling Microscopy (STM)
Principles of STM
STM imaging
STM spectroscopy
Atomic-Force Microscopy (AFM)
The different operation modes
Electric-Force Microscopy (EFM) and Nanoelectronics
Detection of ultrasmall forces
Introduction to Near-field Scanning Optical Microscopy (NSOM)
Key concepts in near-field optics
Sub-wavelength photonics
Plasmonics and addressing of single nano-objects
Nanomanipulation by means of Scanning-Probe Microscopy
Quantum corrals, AFM nanolithography, optical nano-tweezers'

Programma definitivo per l'A.A.2009/10
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