SW development and optimization for the 4080 SPEA tester
Thesis in external company
keywords PCB TEST, IN-CIRCUIT TESTERS, TESTING
Reference persons MARCELLO CHIABERGE, MATTEO SONZA REORDA, GIOVANNI SQUILLERO
Research Groups DAUIN - GR-05 - ELECTRONIC CAD & RELIABILITY GROUP - CAD
Description The production of electronic, microelectronic and semiconductor devices will increase consistently in the years to come and since these devices must necessarily be 100% tested at the end of each production line process, automatic machines are needed for faster and faster testing.
SPEA (where the thesis activities will be performed) is the global leader in the production of Flying Probe Testers characterized by fast contact on both sides of the microelectronic devices of the latest technologies.
The aim of the thesis is the development and optimization of the SW available to support the user of the 4080 Flying Probe. Such a SW environment includes one part devoted to the automatic generation of the tests to be applied by the tester, a second one devoted to the run-time control of the tester operations (probe movements and signal application/observation), and a third part devoted to the data analysis and reporting.
The thesis student will be part of the Project Team in charge of the development, validation and characterization of the functions supported by the Tester.
The development with success of the thesis will allow the candidate to get the priority employment status for an engineering position in the New Technologies Design Office.
Required skills Good coding skills
Basic knowledge of SW engineering
Notes SPEA offre i seguenti vantaggi agli studenti selezionati per la tesi:
1. Pranzo pagato per i giorni in SPEA, per tutta la durata dello stage.
2. Premio di 600 euro se l'incarico affidato sarÓ stato svolto con successo.
Deadline 14/10/2023 PROPONI LA TUA CANDIDATURA