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Embedded Non-Volatile memory testing - INFINEON ITALY (stage)

azienda Tesi esterna in azienda    estero Tesi all'estero


Parole chiave TESTING

Riferimenti PAOLO BERNARDI

Gruppi di ricerca GR-05 - ELECTRONIC CAD & RELIABILITY GROUP - CAD

Tipo tesi RICERCA SPERIMENTALE E TEORICA

Descrizione Embedded FLASH memory testing is a fundamental objective of semiconductor industries, given the very large percentage of chips' surface occupied by them. The thesis aims to establish advanced implementation methodologies for validating eFLASH testing flow, including the usage of on-chip test engines to be programmed by firmware, and practical lab measurements. All stages from the concept to the implementation on-chip are covered in the thesis. The student will gain a broad insight into industrial SoC development. In collaboration with INFINEON, Munich.

Conoscenze richieste Being familiar with digital circuit design
Knowledge about design for test (DFT)
EDA tools (Simulation-Fault simulation) and Python
Measurement Equipment

Note The thesis worksite is Padova, Italy. The Infineon company grants a salary to the enrolled student.


Scadenza validita proposta 15/05/2023      PROPONI LA TUA CANDIDATURA