Selft-test programs for industrial microcontrollers
Research Groups ELECTRONIC CAD & RELIABILITY GROUP - CAD
Thesis type EXPERIMENTAL
Description Companies in the automotive domain are investing huge resources in the development of autonomous and semi-autonomous driving vehicles. In this scenario it is clear the importance of techniques allowing to effectively face the occurrence of faults affecting the electronic systems on-board these vehicles. An innovative approach tackling this issue is based on suitable programs that can be periodically run by these systems and test their health (self-test). The thesis aims at the development of such programs for microcontrollers used for automotive applications and will benefit of the cooperation existing between the research group and STMicroelectronics.
Required skills VHDL or VERILOG, pipelined processor architecture
Deadline 30/11/2015 PROPONI LA TUA CANDIDATURA