| KEYWORD |
New optimized algorithms for the automatic generation of optimal test sequences for IEEE 1687 networks
keywords IEEE 1687, OPTIMIZATION ALGORITHMS, TEST
Reference persons EDGAR ERNESTO SANCHEZ SANCHEZ, MATTEO SONZA REORDA
External reference persons Riccardo Cantoro
Research Groups ELECTRONIC CAD & RELIABILITY GROUP - CAD
Description The thesis is connected to the activities of the BASTION project (http://fp7-bastion.eu/), funded by the European Commission.
In the last years, Integrated Circuits started to include more and more instruments, aimed at providing information useful to debug, characterize, and monitor the behavior of the circuit. The recently approved IEEE 1687 standard provides an effective way to access them, typically through a IEEE 1149 interface. This is accomplished by resorting to a programmable scan network on board the circuit.
Recently, some of the BASTION partners (Politecnico di Torino in Italy and Lund University in Sweden) jointly proposed (see attached paper) a technique to test such a network, thus making feasible to detect any fault possibly affecting it. The algorithm for test generation can be formally expressed using two graphs. The thesis aims at developing a SW tool able to
- read the description of the network
- build the corresponding graphs
- perform some traversal of the two graphs according to an algorithm which provides the minimum duration test sequence.
See also paper_cr_v4.pdf
Required skills Good programming skills
Basic knolwedge about the graph theory
Deadline 16/02/2017
PROPONI LA TUA CANDIDATURA