PORTALE DELLA DIDATTICA

Ricerca CERCA
  KEYWORD

Machine Learning and Computer Aided Design

keywords CLASSIFICATION ALGORITHMS, COMPUTATIONAL INTELLIGENCE, COMPUTER AIDED DESIGN, MACHINE LEARNING, REGRESSION ALGORITHMS, TEST

Reference persons RICCARDO CANTORO, GIOVANNI SQUILLERO

Research Groups GR-05 - ELECTRONIC CAD & RELIABILITY GROUP - CAD

Thesis type EXPERIMENTAL

Description The thesis will tackle a quite practical and important application of machine learning. The goal is to design a methodology to be integrated in existing industrial workflows: building a model able to predict the good/fail classification of electronic devices based on manufacturing data from wafer tests. In the specific context the different errors (false positive or false negative) have different impacts on the quality of the result. For a limited number of devices, the maximum frequencies of functional patterns is also available, and this information could be used for building a regression model.

Required skills Required: programming skill
Desired: python3, statistics


Deadline 31/01/2019      PROPONI LA TUA CANDIDATURA