| KEYWORD |
Study, analysis and correlation of the breakdown of electronic devices with the manufacturing process
keywords ELECTRONICS DEVICES, FAILURE ANALISYS, MICROELECTRONICS
Reference persons SERGIO FERRERO, LUCIANO SCALTRITO
Research Groups AA - Materials and Processes for Micro and Nano Technologies
Thesis type EXPERIMENTAL RESEARCH, EXPERIMENTAL/MODELLING
Description The production yield is a key point for the the fabrication's sustainability of a electronics device. This thesis activity faces on field the reliability of a microelectronics fabrication process in order to recognize the material or the process that cause the random failure of a huge number of devices on each processed wafer.
Required skills The candidate must demonstrate a complete mastery of the manufacturing processes of electronic micro-devices, the main characterization techniques of semiconductor materials, both surface and bulk and good data analysis skills.
Deadline 17/06/2022
PROPONI LA TUA CANDIDATURA