| KEYWORD |
VLSI cell library reliability analysis methods for the new generation of aerospace integrated circuits
Riferimenti LUCA STERPONE
Gruppi di ricerca GR-05 - ELECTRONIC CAD & RELIABILITY GROUP - CAD
Descrizione Todays, integrated circuits used in aerospace applications require must be enough resilient with respect of several physical phenomena such as termal stress, aging and radiation. The present thesis, done in cooperation with the European Space Agency (ESA) and the Si2 consortium, is oriented to the analysis and mitigation of the 45nm VLSI cell library. This will be done by creating a simulator based on HSPICE.
Scadenza validita proposta 30/10/2019
PROPONI LA TUA CANDIDATURA