PORTALE DELLA DIDATTICA

Ricerca CERCA
  KEYWORD

Area Engineering

Study, analysis and correlation of the breakdown of electronic devices with the manufacturing process

keywords ELECTRONICS DEVICES, FAILURE ANALISYS, MICROELECTRONICS

Reference persons SERGIO FERRERO, LUCIANO SCALTRITO

Research Groups AA - Materials and Processes for Micro and Nano Technologies

Thesis type EXPERIMENTAL RESEARCH, EXPERIMENTAL/MODELLING

Description The production yield is a key point for the the fabrication's sustainability of a electronics device. This thesis activity faces on field the reliability of a microelectronics fabrication process in order to recognize the material or the process that cause the random failure of a huge number of devices on each processed wafer.

Required skills The candidate must demonstrate a complete mastery of the manufacturing processes of electronic micro-devices, the main characterization techniques of semiconductor materials, both surface and bulk and good data analysis skills.


Deadline 17/06/2022      PROPONI LA TUA CANDIDATURA




© Politecnico di Torino
Corso Duca degli Abruzzi, 24 - 10129 Torino, ITALY
Contatti