KEYWORD |
Area Engineering
Study, analysis and correlation of the breakdown of electronic devices with the manufacturing process
keywords ELECTRONICS DEVICES, FAILURE ANALISYS, MICROELECTRONICS
Reference persons SERGIO FERRERO, LUCIANO SCALTRITO
Research Groups AA - Materials and Processes for Micro and Nano Technologies
Thesis type EXPERIMENTAL RESEARCH, EXPERIMENTAL/MODELLING
Description The production yield is a key point for the the fabrication's sustainability of a electronics device. This thesis activity faces on field the reliability of a microelectronics fabrication process in order to recognize the material or the process that cause the random failure of a huge number of devices on each processed wafer.
Required skills The candidate must demonstrate a complete mastery of the manufacturing processes of electronic micro-devices, the main characterization techniques of semiconductor materials, both surface and bulk and good data analysis skills.
Deadline 17/06/2022
PROPONI LA TUA CANDIDATURA