| KEYWORD |
Noise analysis in FPGA for time and frequency metrology
Thesis in external company
keywords FPGA, METROLOGY, NOISE
Reference persons GIOVANNI ANTONIO COSTANZO
External reference persons Dr. Davide Calonico (INRiM)
Thesis type EXPERIMENTAL
Description The work is focused on the measurements of the noise in a FPGA electronic system usefull in many application for time and frequency metrology. The purpose is to characterize the noise introduced in some blocks of a commercial FPGA in order to predict the effects on a specific metrological application.
Required skills Basic knowledge of electronic measurements. Programming environment and use of FPGA
Deadline 12/12/2019
PROPONI LA TUA CANDIDATURA